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50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

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50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

Name: 50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber
Brand: BOTO
Price: 1 USD

Quality 50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber for sale

Brand Name : BOTO

Model Number : BT-XB-OLT-150

Certification : CE ISO

Place of Origin : China

MOQ : 1set

Payment Terms : L/C, T/T

Supply Ability : 500 Set/Sets per Month

Delivery Time : 5-25 days

Packaging Details : wooden case

Inner size WxHxD(cm) : 60×75×50

External size WxHxD(cm) : 210x220X205

Shock Temperature ragne : -65°C~150°C

Heating up time : RT~200°C about 35min

Cooling down time : RT~-70°C about 90min

Temp recover time/change time : ≤5min / ≤10sec

Temp control accuracy/ distribution accuracy : ±0.5°C / ±2.0°C

Inner materials : SUS 304# stainless steel plate for inner chamber,and stainless steel plate + spray painting for external chamber.

Insulation materials : High-temperature high-density amino acid ethyl ester foam insulator material.

Systems : P.I.D+S.S.R+Microcomputer balanced temperature control system.

Cooling systems : Semi-hermetic two-stage compressor (water-cooled) / hermetic two-stage compressor (air-cooled).

Safety devices : Fuse switch, high and low pressure protection switch compressors, refrigerant pressure protection switch failure warning system, electronic siren.

Fitting : Outlook window (special purchase), the upper and lower adjustable compartment two energized measured line hole, casters,level bracket.

Power : 3 phase AC108V-380V 50HZ/60HZ

Controller : Taiwan TATO or TH900C

Compressor : Germany Bitzer Brand

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50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts

Thermal Shock Environment Test Chamber

Corresponding Standard:

GB11158 GB10589-89 GB10592-89 GB/T10586-89 GB/T2423.22-2001 GB/T2423.1-2001 GB/T2423.2-2001 GB/T2423.3-93 GB/T2423.4-93 ASTM D1735 EIA - 364-59
IEC60068-2-1.1990 IEC60068-2-2.1974 IEC 68-2-30 IEC68-2-03 EIA - 364-31C

XB-OLT-50	XB-OLT-80	XB-OLT-150	XB-OLT-225	XB-OLT-408
Inner size WxHxD(cm)	36×40×35	40×50×40	50×60×50	60×75×50	80×85×60
External size WxHxD(cm)	138x180x155	150X190X160	190x200X195	210x220X205	225x250x220
Shock Temperature ragne	-65°C~150°C
Heating up time	RT~200°C about 35min
Cooling down time	RT~-70°C about 90min
Temp recover time/change time	≤5min / ≤10sec
Temp control accuracy/ distribution accuracy	±0.5°C / ±2.0°C
Inner materials	SUS 304# stainless steel plate for inner chamber,and stainless steel plate + spray painting for external chamber.
Insulation materials	High-temperature high-density amino acid ethyl ester foam insulator material.
Systems	P.I.D+S.S.R+Microcomputer balanced temperature control system.
Cooling systems	Semi-hermetic two-stage compressor (water-cooled) / hermetic two-stage compressor (air-cooled).
Safety devices	Fuse switch, high and low pressure protection switch compressors, refrigerant pressure protection switch failure warning system, electronic siren.
Fitting	Outlook window (special purchase), the upper and lower adjustable compartment two energized measured line hole, casters,level bracket.
Power	3 phase AC108V-380V 50HZ/60HZ
Controller	Taiwan TATO or TH900C
Compressor	Germany Bitzer Brand

50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

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50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

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50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber

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Thermal Shock Environment Test Chamber

50L 60L 80L 100L 150L 200L Lab Electronic Temperature Semiconductors Chips Parts Thermal Shock Environment Test Chamber Images